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Electronic materials

Our research in this area includes

  • electrical characterisation facilities including current-voltage and capacitance-voltage measurements and sheet resistance measurements
  • structural characterisation by high resolution scanning electron microscopy and transmission electron microscopy, both with energy dispersive X-ray analysis capabilities
  • a high resolution Deep Level Transient Spectroscopy setup which can examine low concentrations of electrically active defects in both wide and narrow bandgap crystalline materials
  • photoluminescence with an Ar ion laser for probing optically active defects and/or electronic band structure
  • X-ray diffraction for strain measurements
  • X-ray florescence
  • atomic force microscopy for surface analysis
  • optical characterisation of thin films with spectroscopicellipsometry, SPR, UV-vis absorption and fluorescent spectroscopy



Facilities, projects, publications and services

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Project summary

A series of case studies illustrating how access to Sophisticated Evolved Gas Analysis can provide manufacturers with information about...

Electronic materials, Materials testing, Materials analysis

News

A NATO-organised summit chaired by a Sheffield Hallam academic has discussed the science behind full body scanners as airports begin to...

Research opportunities

Theory of thermal management of intersubband emitters
Theory of broadband Quantum Cascade Lasers
Microscopic theory for light coupling with intersubband transitions

Featured staff profile

Related services

Our electronic materials characterisation facilities include the following

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