X-Ray Diffraction Analysis

Duration: 1997-present

X-ray diffraction stress analysis allows detailed determinations of the magnitude and nature of the stresses present in coating systems. XRD equipment in the MRI is equipped with an Omega goniometer that allows measurement of Psi-squared spectra for stress determination. The periodic composition modulation and superlattice in our hard coatings may also be determined by X-ray analysis.

Our XRD equipment is equipped with an Omega goniometer that allows measurement of Psi-squared spectra. This allows detailed determinations of the magnitude and nature of the stresses present in coating systems.

This work is performed by one of the Group’s senior academics who, as part of a Human Capital Mobility Programme (The Royal Institute of Engineering), recently spent a six month sabbatical at Charles University in Prague with Professor Valvode using specialist XRD equipment and expertise there.

Project staff: Dr O B Lewis