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SEM instruments

FEI NOVA 200 NanoSEM

  • Field emission gun (FEG)
  • High spatial resolutions of 1.5 – 2.0 nm (15 – 30 KV) or 2.5 – 5.0 nm (1 KV)
  • Compatible to both high vacuum and low-pressure environments;
  • Energy dispersive X-ray spectroscopy (EDX or EDS)

Philips XL-40 SEM

  • Tungsten filament;
  • Spatial resolution 3.5 – 5 nm (15-30 KV)
  • High vacuum only;
  • Energy dispersive X-ray spectroscopy (EDX or EDS)

CamScan SEM

  • Tungsten filament;
  • Spatial resolution 5~ nm (15-30 KV);
  • With hot stage at high temperatures up to 1,2000C for in-situ imaging/video observation of mechanical testing, grain growth and solid phase transformation.

FEI Quanta 3D FEG/FIB ESEM

For more information on our SEM services relating to research and consultancy, please contact Dr. Quanshun Luo

Back to Scanning Electron Microscopy (SEM)

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