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Scanning Kelvin Probe (SKP)

Model: Uniscan SKPR1171

The scanning Kelvin probe is a non-contact, non-destructive instrument designed to measure the surface work function difference between conducting, coated, or semi-conducting materials and a metallic probe. The SKP at MERI has the ability to make measurements in a humid or gaseous environment and is capable of examining conducting and semi-conducting materials. The Kelvin probe measures the work function of a material, which in turn can be related to its corrosion potential, Ecorr

Applications of the SKP include

  • Filiform corrosion studies
  • Transport process of hydrated ions
  • Study of fuel cell catalysts
  • Characterisation of photovoltaic materials
  • Femi-level mapping

The scanning Kelvin probe is part of our Uniscan M370 Scanning Electrochemical Workstation.

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