X-ray fluorescence spectrometry (XRF)
The wavelength dispersive Philips PW2440 sequential X-ray fluorescence spectrometer provides analytical facilities for the determination of concentrations of elements present in solids, powders and liquids.
The technique covers the elemental range from boron, B to americium, Am with concentration capabilities from ppm to 100%. Used mainly for quantitative bulk analysis of inorganic analytes, the technique also finds applications for the analysis of coatings and surface contaminants.
The XRF team have many years experience in sampling and the preparation of specimens for both quantitative and semi-quantitative applications. We provide advanced training for those using the XRF technique in industry and research through a range of career development opportunities in materials analysis.
Our XRF consultancy operation provides a confidential and independent service for method development, calibration and rapid realisation of material composition delivered via rigorous quality procedures. We also work as participating analysts for a number of institutions to assist in the generation of certified reference materials.
Oxide analysis of
- glass, ceramics and polymers
- refractories and slags
- rocks and minerals
- cements and mortars
- soils, sediments and sludges
- airborne particles
Elemental analysis of
- ferrous aluminium and copper bases alloys
Semi-quantitative analysis for
- small samples
- unknown samples
- screening of contaminated land
For more X-ray fluorescence spectrometry (XRF) services please visit here.
To find out more services we can provide please submit your enquiry or contact us on 0114 225 3500