Electronic Materials

Electronic Materials

Our electronic materials characterisation facilities include

  • electrical characterisation facilities including current-voltage and capacitance-voltage measurements and sheet resistance measurements
  • structural characterisation by high resolution scanning electron microscopy and transmission electron microscopy, both with energy dispersive X-ray analysis capabilities
  • a high resolution Deep Level Transient Spectroscopy setup which can examine low concentrations of electrically active defects in both wide and narrow bandgap crystalline materials
  • photoluminescence with an Ar ion laser for probing optically active defects and/or electronic band structure
  • X-ray diffraction for strain measurements
  • X-ray florescence
  • atomic force microscopy for surface analysis
  • optical characterisation of thin films with spectroscopic ellipsometry, SPR, UV-vis absorption and fluorescent spectroscopy
For more information please contact MERI reception on 0114 225 3500 or email meri@shu.ac.uk

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